Facility ID: 1008262 · Other

Jireh Semiconductor, Inc.

Every figure on PlainCarbon is rendered directly from EPA Greenhouse Gas Reporting Program (GHGRP) data, no number is typed in by an editor. This page draws directly on the EPA Greenhouse Gas Reporting Program (GHGRP), no figure is typed in by an editor. See our editorial standards & corrections policy, the methodology behind these numbers, or report a data error.

Verify with EPA →

Hillsboro, OR · WASHINGTON COUNTY · NAICS 334413

Data updated May 2026

111K
MT CO2e (2023)
13
Reporting Years
OR
State

Annual Emissions History

2011
2012
2013
2014
2015
2016
2017
2018
2019
2020
2021
2022
2023
Year Total CO2e (MT)
2023 110,902
2022 106,933
2021 98,843
2020 95,144
2019 95,771
2018 90,952
2017 95,538
2016 79,505
2015 62,094
2014 68,527
2013 53,647
2012 45,044
2011 49,855

Facility Insight: Jireh Semiconductor, Inc.

Jireh Semiconductor, Inc. (EPA GHGRP Facility ID 1008262) reported 111K metric tons of CO2-equivalent in 2023, operating in Hillsboro, OR within WASHINGTON COUNTY. The site is classified under Other with NAICS code 334413.

The facility has 13 years of reported data on record, covering the 2011–2023 window. Over that period, annual CO2e emissions rose by 122.4%, with the peak observed year showing up to 111K MT CO2e.

Emissions Analysis

Jireh Semiconductor, Inc. is a moderate emitter at 111K MT CO2e, typical of mid-sized industrial operations.

Frequently Asked Questions

How much CO2 does Jireh Semiconductor, Inc. emit?

Jireh Semiconductor, Inc. reported 111K MT CO2e in 2023.

Is Jireh Semiconductor, Inc. reducing emissions?

Over 13 reporting years (2011–2023), Jireh Semiconductor, Inc.'s emissions have increased by 122.4%. This may reflect expanded operations or increased production.

Data sourced from the EPA Greenhouse Gas Reporting Program (GHGRP), Facility ID 1008262. Data subject to facility self-reporting, not compliance advice. See our methodology for how this data is sourced, computed, and verified. Retrieved and formatted by PlainCarbon Editorial